Applications of a free electron laser to atomic and molecular physics
Description
With crossed beam experiments in atomic and molecular physics, the gas pressure in the sample chamber is typically of the order of 5 x 10-5 Torr. Furthermore, many of the more interesting investigations such as photoelectron and fluorescence spectroscopy of specific processes have photoionization cross sections in the vicinity of 0.1 Mb (10-19 cm2), or less. In a lcm path length, therefore, the fraction of photons absorbed is only about 10-7. These absorbed photons produce ions, electrons, and fluorescence from excited states. As a practical example of what can be achieved by a high flux source, the authors present some results using undispersed synchrotron radiation from Tantalus, the low-energy (240 MeV) storage ring at Stoughton, Wisconsin
Additional details
Publishing Information
- Publisher
- Optical Society of America.
- Imprint Place
- Washington, DC (USA)
- ISBN
- 1-55752-028-3
- Imprint Title
- Free-electron laser applications in the ultraviolet
- Imprint Pagination
- vp.
- Series
- 1988 technical digest series. Volume 4.
- Journal Page Range
- p. 62-65.
Conference
- Title
- Topical meeting on free-electron laser applications in the ultraviolet.
- Dates
- 2-5 Mar 1988.
- Place
- Cloudcroft, NM (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 20081297
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS; S74: ATOMIC AND MOLECULAR PHYSICS; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- ABSORPTION SPECTRA; ATOMIC PHYSICS; BEAM OPTICS; CROSS SECTIONS; ELECTRONS; EXCITED STATES; EXPERIMENTAL DATA; FLUORESCENCE SPECTROSCOPY; FREE ELECTRON LASERS; IONS; LIGHT SOURCES; MEV RANGE 100-1000; MOLECULES; PARTICLE PRODUCTION; PHOTOELECTRON SPECTROSCOPY; PHOTOIONIZATION; PHOTONS; STORAGE RINGS; SYNCHROTRON RADIATION
- Descriptors DEC
- AMPLIFIERS; BOSONS; BREMSSTRAHLUNG; CHARGED PARTICLES; DATA; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELEMENTARY PARTICLES; EMISSION SPECTROSCOPY; ENERGY LEVELS; ENERGY RANGE; EQUIPMENT; FERMIONS; INFORMATION; IONIZATION; LASERS; LEPTONS; MASSLESS PARTICLES; MEV RANGE; NUMERICAL DATA; PHYSICS; RADIATION SOURCES; RADIATIONS; SPECTRA; SPECTROSCOPY
Optional Information
- Secondary number(s)
- CONF-880318--.