Published October 30, 2009 | Version v1
Journal article

Conductive thin film multilayers of gold on glass formed by self-assembly of multiple size gold nanoparticles

  • 1. Department of Chemistry, North Carolina State University, Raleigh, North Carolina, 27695 (United States)
  • 2. Department of Physics and Astronomy, Appalachian State University, Boone, North Carolina, 28608 (United States)

Description

Highly conductive thin films of gold have been fabricated on glass substrates by the deposition of gold nanoparticles of two different diameters. A deposition sequence, alternating between 2.6-nm and 12-nm diameter particles, was used whereby the 2.6-nm particles served to fill in the gaps created by the assembly of the larger 12-nm diameter particles. The resulting thin films, with thicknesses of less than 35 nm, displayed high conductivities, yet were fabricated in substantially fewer deposition cycles than required by previous methods. Analysis of surface morphology performed by atomic force microscopy and scanning electron microscopy showed that the high conductivity is the result of a less porous surface structure than can be achieved through the layering of a single size nanoparticle. Conductivity analysis was performed by 4-point probe with resistivities of 5.00 ± 0.4 x 10-6 Ω m for 5 layers and 4.49 ± 0.2 x 10-6 Ω m for the 6-layer films.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2009.05.033

Additional details

Identifiers

DOI
10.1016/j.tsf.2009.05.033;
PII
S0040-6090(09)00984-5;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
517
Journal Issue
24
Journal Page Range
p. 6803-6808
ISSN
0040-6090
CODEN
THSFAP

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42054724
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ATOMIC FORCE MICROSCOPY; DEPOSITION; GLASS; GOLD; LAYERS; MORPHOLOGY; NANOSTRUCTURES; POROUS MATERIALS; SCANNING ELECTRON MICROSCOPY; THIN FILMS
Descriptors DEC
ELECTRON MICROSCOPY; ELEMENTS; FILMS; MATERIALS; METALS; MICROSCOPY; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.