A CMOS delay locked loop and sub-nanosecond time-to-digital converter chip
Creators
- 1. Aveiro Univ. (Portugal)
- 2. Lawrence Berkeley National Lab., CA (United States)
Description
Phase-locked loops have been employed in the past to obtain sub-nanosecond time resolution in high energy physics and nuclear science applications. An alternative solution based on a delay-locked loop (DLL) is described. This solution allows for a very high level of integration yet still offers resolution in the sub-nanosecond regime. Two variations on this solution are outlined. A novel phase detector, based on the Mueller C-element, is used to implement a charge pump where the injected charge approaches zero as the loop approaches lock on the leading edge of an input clock reference. This greatly reduces timing jitter. In the second variation the loop locks to both the leading and trailing clock edges. In this second implementation, software coded layout generators are used to automatically layout a highly integrated, multichannel, time-to-digital converter (TDC) targeted for one specific frequency. The two circuits, DLL and TDC, are implemented in CMOS 1.2 microm and 0.8 microm technologies, respectively. Test results show a timing jitter of less than 30 ps for the DLL circuit and less than 190 ps integral and differential nonlinearity for the TDC circuit
Additional details
Publishing Information
- Journal Title
- IEEE Transactions on Nuclear Science
- Journal Volume
- 43
- Journal Issue
- 3Pt2
- Journal Page Range
- p. 1717-1719.
- ISSN
- 0018-9499
- CODEN
- IETNAE
Conference
- Title
- IEEE nuclear science symposium and medical imaging conference.
- Dates
- 23-28 Oct 1995.
- Place
- San Francisco, CA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 27075671
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANALOG-TO-DIGITAL CONVERTERS; DESIGN; INTEGRATED CIRCUITS; PERFORMANCE; RADIATION DETECTORS; RESOLUTION; TIME MEASUREMENT; TIMING CIRCUITS; TIMING PROPERTIES
- Descriptors DEC
- ELECTRONIC CIRCUITS; ELECTRONIC EQUIPMENT; EQUIPMENT; MEASURING INSTRUMENTS
Optional Information
- Secondary number(s)
- CONF-951073--.