Published June 1996 | Version v1
Journal article

A CMOS delay locked loop and sub-nanosecond time-to-digital converter chip

  • 1. Aveiro Univ. (Portugal)
  • 2. Lawrence Berkeley National Lab., CA (United States)

Description

Phase-locked loops have been employed in the past to obtain sub-nanosecond time resolution in high energy physics and nuclear science applications. An alternative solution based on a delay-locked loop (DLL) is described. This solution allows for a very high level of integration yet still offers resolution in the sub-nanosecond regime. Two variations on this solution are outlined. A novel phase detector, based on the Mueller C-element, is used to implement a charge pump where the injected charge approaches zero as the loop approaches lock on the leading edge of an input clock reference. This greatly reduces timing jitter. In the second variation the loop locks to both the leading and trailing clock edges. In this second implementation, software coded layout generators are used to automatically layout a highly integrated, multichannel, time-to-digital converter (TDC) targeted for one specific frequency. The two circuits, DLL and TDC, are implemented in CMOS 1.2 microm and 0.8 microm technologies, respectively. Test results show a timing jitter of less than 30 ps for the DLL circuit and less than 190 ps integral and differential nonlinearity for the TDC circuit

Additional details

Publishing Information

Journal Title
IEEE Transactions on Nuclear Science
Journal Volume
43
Journal Issue
3Pt2
Journal Page Range
p. 1717-1719.
ISSN
0018-9499
CODEN
IETNAE

Conference

Title
IEEE nuclear science symposium and medical imaging conference.
Dates
23-28 Oct 1995.
Place
San Francisco, CA (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
27075671
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANALOG-TO-DIGITAL CONVERTERS; DESIGN; INTEGRATED CIRCUITS; PERFORMANCE; RADIATION DETECTORS; RESOLUTION; TIME MEASUREMENT; TIMING CIRCUITS; TIMING PROPERTIES
Descriptors DEC
ELECTRONIC CIRCUITS; ELECTRONIC EQUIPMENT; EQUIPMENT; MEASURING INSTRUMENTS

Optional Information

Secondary number(s)
CONF-951073--.