Published June 1994 | Version v1
Journal article Metadata-only

Element localized enrichment on Cu-12at.%Au alloy surface induced by ion sputtering

Creators

  • 1. Academia Sinica, Shanghai, SH (China). Shanghai Inst. of Nuclear Research
  • 2. Hangzhou Univ. (China)

Description

The scanning electron microscopy (SEM) combined with electron probe micro-analyzer (EPMA) technique was used to measure the composition difference between the convex and concave regions of the sputtered surface. The experimental results show that the 'surface element localized enrichment' phenomenon occurs in a single-phase Cu-12at.% Au alloy after 30 keV Ar+ ions bombardment to a dose of 1.4 x 1018 ions/cm2 as in multi-phase alloys. A model considering the effects of both the initial stage of the localized enrichment and the capillary pressure (Laplace pressure) producing a selective drift force was proposed for explaining these results

Additional details

Publishing Information

Journal Title
Nuclear Techniques
Journal Volume
17
Journal Issue
6
Journal Page Range
p. 326-331.
ISSN
0253-3219
CODEN
NUTEDL

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
26043844
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ANGULAR DISTRIBUTION; ARGON IONS; CHEMICAL COMPOSITION; COPPER BASE ALLOYS; ELECTRON PROBES; GOLD ALLOYS; KEV RANGE 10-100; MATHEMATICAL MODELS; MORPHOLOGICAL CHANGES; SCANNING ELECTRON MICROSCOPY; SPUTTERING; SURFACES
Descriptors DEC
ALLOYS; CHARGED PARTICLES; COPPER ALLOYS; DISTRIBUTION; ELECTRON MICROSCOPY; ENERGY RANGE; IONS; KEV RANGE; MICROSCOPY; PROBES; TRANSITION ELEMENT ALLOYS