Diamond identification
Description
Methods of producing sets of records of the internal defects of diamonds as a means of identification of the gems by x-ray topography are described. To obtain the records one can either use (a) monochromatic x-radiation reflected at the Bragg angle from crystallographically equivalent planes of the diamond lattice structure, Bragg reflections from each such plane being recorded from a number of directions of view, or (b) white x-radiation incident upon the diamond in directions having a constant angular relationship to each equivalent axis of symmetry of the diamond lattice structure, Bragg reflections being recorded for each direction of the incident x-radiation. By either method an overall point-to-point three dimensional representation of the diamond is produced. (U.K.)
Availability note (English)
MF available from INIS under the Report Number.Files
10493515.pdf
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Additional details
Publishing Information
- Imprint Pagination
- 6 p.
- IPC:
- Int. Cl. G01n23/20.
- IPC
- Int. Cl. G01n23/20.
- Patent number
- GB patent document 1547371/A/
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 10493515
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- BRAGG REFLECTION; CRYSTAL DEFECTS; CRYSTAL LATTICES; DIAMONDS; PATTERN RECOGNITION; RECORDING SYSTEMS; TOPOGRAPHY; X RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- CARBON; COHERENT SCATTERING; CRYSTAL STRUCTURE; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELEMENTS; IONIZING RADIATIONS; MINERALS; NONMETALS; RADIATIONS; REFLECTION; SCATTERING