The Small-Angle Neutron Scattering Data Analysis of the Phospholipid Transport Nanosystem Structure
Creators
- 1. Joint Institute for Nuclear Research, Dubna 141980 (Russian Federation)
- 2. V.N. Orekhovich Research Institute for Biomedical Chemistry, Moscow (Russian Federation)
Description
The small-angle neutron scattering technique (SANS) is employed for investigation of structure of the phospholipid transport nanosystem (PTNS) elaborated in the V.N.Orekhovich Institute of Biomedical Chemistry (Moscow, Russia). The SANS spectra have been measured at the YuMO small-angle spectrometer of IBR-2 reactor (Joint Institute of Nuclear Research, Dubna, Russia). Basic characteristics of polydispersed population of PTNS unilamellar vesicles (average radius of vesicles, polydispersity, thickness of membrane, etc.) have been determined in three cases of the PTNS concentrations in D2O: 5%, 10%, and 25%. Numerical analysis is based on the separated form factors method (SFF). The results are discussed in comparison with the results of analysis of the small-angle X-ray scattering spectra collected at the Kurchatov Synchrotron Radiation Source of the National Research Center "Kurchatov Institute" (Moscow, Russia). (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/1023/1/012017Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 1023
- Journal Issue
- 1
- Journal Page Range
- [6 p.]
- ISSN
- 1742-6596
Conference
- Title
- 22. International School on Nuclear Physics, Neutron Physics and Applications
- Dates
- 10-16 Sep 2017
- Place
- Varna (Bulgaria)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52080685
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CONCENTRATION RATIO; DATA ANALYSIS; NANOSTRUCTURES; NEUTRON DIFFRACTION; NUMERICAL ANALYSIS; SMALL ANGLE SCATTERING; SPECTROMETERS; SYNCHROTRON RADIATION SOURCES; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DATA PROCESSING; DIFFRACTION; DIMENSIONLESS NUMBERS; MATHEMATICS; MEASURING INSTRUMENTS; PROCESSING; RADIATION SOURCES; SCATTERING