Published January 23, 1990 | Version v1
Patent

X-ray apparatus

Description

This patent describes an X-ray apparatus. It comprises: a radiation source which irradiates a cross-section of an examination zone by means of a primary beam of substantially monochromatic radiation wherein the primary beam interacts with the cross-section of the examination zone to produce elastically scattered X-ray quanta from the examination zone

Availability note (English)

Patent and Trademark Office, Box 9, Washington, DC 20232 (USA).

Additional details

Publishing Information

Imprint Pagination
vp.
IPC:
Int. Cl. G01N 23/201.
IPC
Int. Cl. G01N 23/201.
Patent number
US patent document 4,896,342/A/

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
22004768
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Non-conventional Literature
Descriptors DEI
BEAM POSITION; COINCIDENCE METHODS; CROSS SECTIONS; ELASTIC SCATTERING; IRRADIATION; MONOCHROMATIC RADIATION; POSITION SENSITIVE DETECTORS; X-RAY EQUIPMENT; X-RAY SOURCES
Descriptors DEC
COUNTING TECHNIQUES; ELECTROMAGNETIC RADIATION; EQUIPMENT; MEASURING INSTRUMENTS; RADIATION DETECTORS; RADIATION SOURCES; RADIATIONS; SCATTERING