Published January 23, 1990
| Version v1
Patent
X-ray apparatus
Description
This patent describes an X-ray apparatus. It comprises: a radiation source which irradiates a cross-section of an examination zone by means of a primary beam of substantially monochromatic radiation wherein the primary beam interacts with the cross-section of the examination zone to produce elastically scattered X-ray quanta from the examination zone
Availability note (English)
Patent and Trademark Office, Box 9, Washington, DC 20232 (USA).Additional details
Publishing Information
- Imprint Pagination
- vp.
- IPC:
- Int. Cl. G01N 23/201.
- IPC
- Int. Cl. G01N 23/201.
- Patent number
- US patent document 4,896,342/A/
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 22004768
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Non-conventional Literature
- Descriptors DEI
- BEAM POSITION; COINCIDENCE METHODS; CROSS SECTIONS; ELASTIC SCATTERING; IRRADIATION; MONOCHROMATIC RADIATION; POSITION SENSITIVE DETECTORS; X-RAY EQUIPMENT; X-RAY SOURCES
- Descriptors DEC
- COUNTING TECHNIQUES; ELECTROMAGNETIC RADIATION; EQUIPMENT; MEASURING INSTRUMENTS; RADIATION DETECTORS; RADIATION SOURCES; RADIATIONS; SCATTERING