Investigation of enamel-type phase anodic tantalum oxide composition by labelled atoms method and chemical analysis

Experimental data obtained by the tracer techniques and chemical analysis on implantation of H2SO4- and F- anions into the phase anodic tantalum oxide are presented. The effects of the current density, temperature, electrolyte concentration and time of the process on the anions contents and the anodic oxide thickness were established. Conditions of the anodic oxide transition into the metal electropolished surface were found. Ionic-molecular formula was derived describing the composition of the phase anodic oxide being ivestigated