Published October 1, 2001
| Version v1
Journal article
Pulse shape discrimination of charged particles with a silicon strip detector
Description
A simple and effective pulse shape discrimination technique is applied to a silicon strip detector array. Excellent charge identification from H up to the Ni projectile has been obtained and isotope separation up to N has also been observed. The method we systematically studied is essentially based on a suitable setting of the constant fraction discriminators, and its main advantage is that no additional electronic modules are needed compared to the ones used in the standard TOF technique
Additional details
Identifiers
- PII
- S0168900201008051;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 471
- Journal Issue
- 3
- Journal Page Range
- p. 374-379
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Germany
- INIS RN
- 34037517
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ION DETECTION; PARTICLE DISCRIMINATION; POSITION SENSITIVE DETECTORS; PROTON DETECTION; PULSE TECHNIQUES; SI SEMICONDUCTOR DETECTORS
- Descriptors DEC
- CHARGED PARTICLE DETECTION; DETECTION; MEASURING INSTRUMENTS; PARTICLE IDENTIFICATION; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS
Optional Information
- Copyright
- Copyright (c) 2001 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.