Published January 2006
| Version v1
Journal article
Structural investigation of CdSSe-nanocrystals synthesized by ion-beam-implantation
- 1. Institut fuer Physik, Universitaet Augsburg, Universitaetsstrasse 1, D-86135 Augsburg (Germany)
Description
II-VI semiconductor nanoparticle systems can be prepared by keV high-dose ion implantation and subsequent thermal annealing. The ternay Cd-S-Se system offers an additional degree of freedom to adjust materials properties, as Se and S are completely miscible on the Se sublattice. X-ray diffraction analysis indicates, that hexagonal CdS xSe1-x nanocrystals are formed after rapid thermal annealing. Peak positions are evaluated using Vegard's law. Material loss is monitored quantitatively by Rutherford backscattering spectroscopy (RBS). Cross-sectional TEM images are revealing strong influence of the composition on the nanocrystal structural evolution
Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2005.08.196;
- PII
- S0168-583X(05)01498-9;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 242
- Journal Issue
- 1-2
- Journal Page Range
- p. 170-172
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 14. international conference on ion beam modification of materials
- Dates
- 5-10 Sep 2004
- Place
- Pacific Grove, CA (United States)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37068410
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; CADMIUM SULFIDES; DEGREES OF FREEDOM; ION BEAMS; ION IMPLANTATION; KEV RANGE; NANOSTRUCTURES; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTOR MATERIALS; SYNTHESIS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- BEAMS; CADMIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ENERGY RANGE; HEAT TREATMENTS; INORGANIC PHOSPHORS; MATERIALS; MICROSCOPY; PHOSPHORS; SCATTERING; SPECTROSCOPY; SULFIDES; SULFUR COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.