Published February 1, 2006 | Version v1
Journal article

Electrochromic materials and devices: Brief survey and new data on optical absorption in tungsten oxide and nickel oxide films

  • 1. Department of Engineering Sciences, The Angstroem Laboratory, Uppsala University, P. O. Box 534, SE-75121 Uppsala (Sweden)
  • 2. ChromoGenics Sweden AB, c/o Uppsala University Holding, Uppsala Science Park, SE-75183 Uppsala (Sweden)

Description

Current work on inorganic electrochromic materials and devices is reviewed briefly, and the emphasis on thin films of W oxide and Ni oxide is pointed out. New results are presented on the optical properties for sputter-deposited thin films of these two materials: for Li+ intercalated sub-stoichiometric W oxide, it is shown that the absorption can be reconciled with an extended 'site saturation' model accounting for electronic transitions between W ions in 6+, 5+, and 4+ states, and for H+ deintercalated Ni oxide, it is found that the coloration efficiency is higher than in prior work presumably as a consequence of the nanocrystalline structure ensuing from the deposition conditions

Additional details

Identifiers

DOI
10.1016/j.tsf.2005.08.183;
PII
S0040-6090(05)01419-7;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
496
Journal Issue
1
Journal Page Range
p. 30-36
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
4. international symposium on transparent oxide thin films for electronics and optics
Acronym
TOEO-4
Dates
7-8 Apr 2005
Place
Tokyo (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37109824
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION; CRYSTALS; DEPOSITION; LITHIUM IONS; NANOSTRUCTURES; NICKEL OXIDES; OPTICAL PROPERTIES; SPUTTERING; THIN FILMS; TUNGSTEN IONS; TUNGSTEN OXIDES
Descriptors DEC
CHALCOGENIDES; CHARGED PARTICLES; FILMS; IONS; NICKEL COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; REFRACTORY METAL COMPOUNDS; SORPTION; TRANSITION ELEMENT COMPOUNDS; TUNGSTEN COMPOUNDS

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.