Published July 1, 2016 | Version v1
Journal article

The establishment of reliability model for LED lamps

  • 1. Opto-Electronics Technology Center, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033 (China)

Description

In order to verify which of the distributions and established methods of reliability model are more suitable for the analysis of the accelerated aging of LED lamp, three established methods (approximate method, analytical method and two-stage method) of reliability model are used to analyze the experimental data under the condition of the Weibull distribution and Lognormal distribution, in this paper. Ten LED lamps are selected for the accelerated aging experiment and the luminous fluxes are measured at an accelerated aging temperature. AIC information criterion is adopted in the evaluation of the models. The results show that the accuracies of the analytical method and the two-stage method are higher than that of the approximation method, with the widths of confidence intervals of unknown parameters of the reliability model being the smallest for the two-stage method. In a comparison between the two types of distributions, the accuracies are nearly identical. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1674-4926/37/7/074010

Additional details

Publishing Information

Journal Title
Journal of Semiconductors
Journal Volume
37
Journal Issue
7
Journal Page Range
[6 p.]
ISSN
1674-4926

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
49094756
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ACCURACY; AGING; APPROXIMATIONS; COMPARATIVE EVALUATIONS; DISTRIBUTION; LIGHT EMITTING DIODES; RELIABILITY; SIMULATION
Descriptors DEC
CALCULATION METHODS; EVALUATION; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES