On the stability of TL traps of alumina
Description
Thermoluminescence (TL) of heat-treated (in the temperature range 450 to 14000C) α-Al2O3 powders have been studied by X-irradiation at room temperature (270C). The TL patterns have indicated essentially two groups of traps; one in the range 50 to 2500C and the other in the range 200 to 4500C. Apart from other thermal stability characteristics, preferential bleaching by light in the wavelength region of 540 to 630 nm has been observed only in the case of the first group of TL traps. It is concluded that the TL phenomena in α-Al2O3 are in general controlled by trace impurities rather than intrinsic lattice defects and the TL traps of the system may be associated with a distribution of trapped holes (O-,O0) stabilized by trace impurities. (author)
Additional details
Publishing Information
- Journal Title
- J. Mater. Sci.
- Journal Volume
- 14
- Journal Issue
- 1
- Series
- J. Mater. Sci.
- Journal Page Range
- 19-24
- ISSN
- 0022-2461
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 10436811
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- ALUMINIUM OXIDES; BLEACHING; CRYSTAL DEFECTS; EXPERIMENTAL DATA; GLOW CURVE; GRAPHS; HEAT TREATMENTS; HIGH TEMPERATURE; HOLES; IMPURITIES; ISOLATED VALUES; MEDIUM TEMPERATURE; PEAKS; PHYSICAL RADIATION EFFECTS; POWDERS; SINTERING; STABILITY; TEMPERATURE DEPENDENCE; THERMOLUMINESCENCE; TRACE AMOUNTS; TRAPS; VERY HIGH TEMPERATURE; X RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; CRYSTAL STRUCTURE; DATA; DATA FORMS; DIFFRACTION; ELECTROMAGNETIC RADIATION; FABRICATION; INFORMATION; IONIZING RADIATIONS; LUMINESCENCE; NUMERICAL DATA; OXIDES; OXYGEN COMPOUNDS; RADIATION EFFECTS; RADIATIONS; SCATTERING