Published 1990
| Version v1
Journal article
Microscopic particle analysis by synchrotron radiation induced x-ray fluorescence (SRXRF) and electron microprobe analysis (EMPA)
Creators
- 1. Hungarian Academy of Sciences, Budapest (Hungary). Central Research Inst. for Physics
Description
The analytical performances of x-ray emission elemental analysis techniques are compared for individual particle analysis. Experiments indicate that SRXRF can be more sensitive than EMPA for small-volume or individual particle analysis of environmental samples for elements with Z > 40. Ni, Cu, Zn and Y could be detected by EMPA, while Cr, Mo, Pb and As by SRXRF. (author) 9 refs.; 2 figs.; 1 tab
Additional details
Additional titles
- Original title (Hungarian)
- Mikroszkopikus reszecskek elemzese szinkrotronsugarzas keltette roentgenfluoreszcenciaval (SRXRF) es elektron-mikroproba analizissel (EMPA)
Publishing Information
- Journal Title
- Izotoptechnika, Diagnosztika
- Journal Volume
- 33
- Journal Issue
- 1-2
- Series
- Izot., Diagn.
- Journal Page Range
- 140-145
- ISSN
- 0865-0497
- CODEN
- IZDIE
Conference
- Title
- 3. Seminary on x-ray emission analysis.
- Original Conference Title
- 3. Roentgenemisszios analitikai szeminarium
- Dates
- 27-29 Nov 1989.
- Place
- Veszprem (Hungary).
INIS
- Country of Publication
- Hungary
- Country of Input or Organization
- Hungary
- INIS RN
- 22015038
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- COMPARATIVE EVALUATIONS; ELECTRON MICROPROBE ANALYSIS; ENVIRONMENTAL MATERIALS; EXPERIMENTAL DATA; HAZARDOUS MATERIALS; PARTICLE SIZE; SENSITIVITY; SYNCHROTRON RADIATION; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTRA
- Descriptors DEC
- BREMSSTRAHLUNG; CHEMICAL ANALYSIS; DATA; ELECTROMAGNETIC RADIATION; EVALUATION; INFORMATION; MATERIALS; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; NUMERICAL DATA; RADIATIONS; SIZE; SPECTRA; X-RAY EMISSION ANALYSIS