Published 1994 | Version v1
Report Metadata-only

An integrated approach to control, monitoring, test, and calibration of silicon micro-strip detector modules and systems

Creators

  • 1. Univ. of Oslo (Norway)

Description

This paper presents a concept integrating traditional slow-control functionality into a Control ampersand Monitoring unit. Functional flexibility and electrical isolation are keywords behind the development

Additional details

Publishing Information

Imprint Title
Proceedings of the conference on computing in high energy physics '94
Imprint Pagination
532 p.
Journal Page Range
p. 444-447.
Report number
LBL--35822

Conference

Title
Meeting on computing in high-energy physics.
Dates
21-27 Apr 1994.
Place
San Francisco, CA (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
26063879
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S99: GENERAL AND MISCELLANEOUS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CALIBRATION; COMPUTER ARCHITECTURE; CONTROL; MONITORING; SI SEMICONDUCTOR DETECTORS; TESTING
Descriptors DEC
MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS

Optional Information

Secondary number(s)
CONF-940492--.