Published 2001
| Version v1
Book
Scattering properties of porous silicon
Creators
- 1. Azzahra Univ., Tehran (Iran, Islamic Republic of). Dept. of Physics
Description
Samples of Porous Silicon (PS) were prepared under electrochemical anodization on silicon wafer. Up to now, many researches has been paid to morphology and optical properties of PS especially on photoluminescence (PL), however the exact mechanisms of them are not known yet. In this paper firstly the theory of light scattering from random rough surfaces, reflection, scattering and transmition from PS were studied and finally the experimental works on PS samples were explained as compared with scattering theory. (author)
Additional details
Publishing Information
- Publisher
- Doctor A.Q. Khan Research Labs., Islamabad Pakistan
- Imprint Place
- Islamabad (Pakistan)
- Imprint Title
- Advanced materials 2001
- Imprint Pagination
- 520 p.
- Journal Page Range
- p. 225-227
Conference
- Title
- 7. International Symposium on Advanced Materials
- Dates
- 17-21 Sep 2001
- Place
- Islamabad (Pakistan)
INIS
- Country of Publication
- Pakistan
- Country of Input or Organization
- Pakistan
- INIS RN
- 34064960
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANODIZATION; BACKSCATTERING; GAUSSIAN PROCESSES; MORPHOLOGY; PHOTOLUMINESCENCE; POROUS MATERIALS; ROUGHNESS; SILICON; SURFACE COATING
- Descriptors DEC
- CHEMICAL COATING; CORROSION PROTECTION; DEPOSITION; ELECTROCHEMICAL COATING; ELECTROLYSIS; ELEMENTS; EMISSION; LUMINESCENCE; LYSIS; MATERIALS; PHOTON EMISSION; SCATTERING; SEMIMETALS; SURFACE COATING; SURFACE PROPERTIES