Published January 25, 2012 | Version v1
Journal article

Cu-doping effects on the physical properties of cadmium sulfide thin films

  • 1. Thin Films Technology Research Laboratory, Department of Physics, COMSATS Institute of Information Technology, Islamabad (Pakistan)
  • 2. Department of Materials Science and Engineering, Tsinghua University, Beijing National Centre of Electron Microscopy, Beijing 100084 (China)
  • 3. Department of Physics, International Islamic University, Islamabad (Pakistan)

Description

Highlights: ► CdS thin films were grown by CSS. ► By ion exchange, Cu was doped. ► Physical properties were investigated. - Abstract: Thin films of CdS were fabricated by close spaced sublimation technique under vacuum of ∼10−5 mbar at a source temperature of 550 °C for various periods of time. These as-deposited thin films were immersed into Cu (NO3)2 solution at 80 ± 5 °C for variety of time to ensure Cu doping. The structural, surface, optical and electrical analyses were completed with the help of X-Ray Diffraction, Scanning Electron Microscope with Energy Dispersive X-Ray, UV-VIS-NIR Spectrophotometer and Hall Measurement System respectively. The transmittance of as-deposited sample is reduced from 80% to 30% with increasing copper immersion time. The mobility increased from 6.67 × 101 to 1.15 × 103 cm2/Vs due to the change in the carrier concentration.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jallcom.2011.09.060

Additional details

Identifiers

DOI
10.1016/j.jallcom.2011.09.060;
PII
S0925-8388(11)01878-0;

Publishing Information

Journal Title
Journal of Alloys and Compounds
Journal Volume
512
Journal Issue
1
Journal Page Range
p. 185-189
ISSN
0925-8388
CODEN
JALCEU

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.