Cu-doping effects on the physical properties of cadmium sulfide thin films
Creators
- 1. Thin Films Technology Research Laboratory, Department of Physics, COMSATS Institute of Information Technology, Islamabad (Pakistan)
- 2. Department of Materials Science and Engineering, Tsinghua University, Beijing National Centre of Electron Microscopy, Beijing 100084 (China)
- 3. Department of Physics, International Islamic University, Islamabad (Pakistan)
Description
Highlights: ► CdS thin films were grown by CSS. ► By ion exchange, Cu was doped. ► Physical properties were investigated. - Abstract: Thin films of CdS were fabricated by close spaced sublimation technique under vacuum of ∼10−5 mbar at a source temperature of 550 °C for various periods of time. These as-deposited thin films were immersed into Cu (NO3)2 solution at 80 ± 5 °C for variety of time to ensure Cu doping. The structural, surface, optical and electrical analyses were completed with the help of X-Ray Diffraction, Scanning Electron Microscope with Energy Dispersive X-Ray, UV-VIS-NIR Spectrophotometer and Hall Measurement System respectively. The transmittance of as-deposited sample is reduced from 80% to 30% with increasing copper immersion time. The mobility increased from 6.67 × 101 to 1.15 × 103 cm2/Vs due to the change in the carrier concentration.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2011.09.060Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2011.09.060;
- PII
- S0925-8388(11)01878-0;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 512
- Journal Issue
- 1
- Journal Page Range
- p. 185-189
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43102702
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CADMIUM SULFIDES; COATINGS; COPPER; COPPER NITRATES; DOPED MATERIALS; ION EXCHANGE; MOBILITY; PHYSICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; SOLUTIONS; SPECTROPHOTOMETERS; SUBLIMATION; SURFACES; THIN FILMS; X RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- CADMIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; COPPER COMPOUNDS; DIFFRACTION; DISPERSIONS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTS; EVAPORATION; FILMS; HOMOGENEOUS MIXTURES; INORGANIC PHOSPHORS; IONIZING RADIATIONS; MATERIALS; MEASURING INSTRUMENTS; METALS; MICROSCOPY; MIXTURES; NITRATES; NITROGEN COMPOUNDS; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; PHOSPHORS; RADIATIONS; SCATTERING; SULFIDES; SULFUR COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.