Published 2005 | Version v1
Miscellaneous

Quantification of trace metals in adsorbents

  • 1. University of Western Sydney, NSW (Australia). School of Science, Nanoscale Organisation and Dynamics Group
  • 2. Pacific Northwest National Laboratory, Washington (United States). Environmental Molecular Science Laboratory

Description

Full text: Adsorbents are porous materials used to remove contaminants from water supplies. Presently, the quantitative trace metal analysis of adsorbents has been carried out using atomic absorption spectroscopy (AAS) and neutron activation analyses (NAA) despite these techniques having many inherent problems. We have used the technique of particle induced x-ray emission (PIXE) to overcome some of the current problems associated with the current techniques and compared the results against NAA and AAS. The results indicate that PIXE is capable of quantifying trace metals in adsorbents although some issues need to be resolved relating to the inhomogeneous internal structure of the adsorbent. Copyright (2005) Australian Institute of Physics

Part of:
16th National Congress of the Australian Institute of Physics. Congress Proceedings Handbook and Abstracts

Additional details

Publishing Information

Imprint Title
16th National Congress of the Australian Institute of Physics. Congress Proceedings Handbook and Abstracts
Imprint Pagination
268 p.
Journal Page Range
p. 223

Conference

Title
16. National Congress of the Australian Institute of Physics. Physics for the Nation
Dates
30 Jan - 4 Feb 2005
Place
Canberra, ACT (Australia)

INIS

Country of Publication
Australia
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37103538
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
ABSORPTION SPECTROSCOPY; ADSORBENTS; METALS; NEUTRON ACTIVATION ANALYSIS; PIXE ANALYSIS; POROUS MATERIALS; WATER
Descriptors DEC
ACTIVATION ANALYSIS; CHEMICAL ANALYSIS; ELEMENTS; HYDROGEN COMPOUNDS; MATERIALS; NONDESTRUCTIVE ANALYSIS; OXYGEN COMPOUNDS; SPECTROSCOPY; X-RAY EMISSION ANALYSIS

Optional Information