Published 2005
| Version v1
Miscellaneous
Quantification of trace metals in adsorbents
- 1. University of Western Sydney, NSW (Australia). School of Science, Nanoscale Organisation and Dynamics Group
- 2. Pacific Northwest National Laboratory, Washington (United States). Environmental Molecular Science Laboratory
Description
Full text: Adsorbents are porous materials used to remove contaminants from water supplies. Presently, the quantitative trace metal analysis of adsorbents has been carried out using atomic absorption spectroscopy (AAS) and neutron activation analyses (NAA) despite these techniques having many inherent problems. We have used the technique of particle induced x-ray emission (PIXE) to overcome some of the current problems associated with the current techniques and compared the results against NAA and AAS. The results indicate that PIXE is capable of quantifying trace metals in adsorbents although some issues need to be resolved relating to the inhomogeneous internal structure of the adsorbent. Copyright (2005) Australian Institute of Physics
Additional details
Identifiers
Publishing Information
- Imprint Title
- 16th National Congress of the Australian Institute of Physics. Congress Proceedings Handbook and Abstracts
- Imprint Pagination
- 268 p.
- Journal Page Range
- p. 223
Conference
- Title
- 16. National Congress of the Australian Institute of Physics. Physics for the Nation
- Dates
- 30 Jan - 4 Feb 2005
- Place
- Canberra, ACT (Australia)
INIS
- Country of Publication
- Australia
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37103538
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; ADSORBENTS; METALS; NEUTRON ACTIVATION ANALYSIS; PIXE ANALYSIS; POROUS MATERIALS; WATER
- Descriptors DEC
- ACTIVATION ANALYSIS; CHEMICAL ANALYSIS; ELEMENTS; HYDROGEN COMPOUNDS; MATERIALS; NONDESTRUCTIVE ANALYSIS; OXYGEN COMPOUNDS; SPECTROSCOPY; X-RAY EMISSION ANALYSIS