Published July 2021 | Version v1
Journal article

Box plots: A simple graphical tool for visualizing overfitting in peak fitting as demonstrated with X-ray photoelectron spectroscopy data

  • 1. Department of Chemistry and Biochemistry, Brigham Young University, Provo, UT, 84602 (United States)
  • 2. Casa Software Ltd., Bay House, Teignmouth (United Kingdom)
  • 3. CNRS, Institut des Matériaux Jean Rouxel, IMN, Université de Nantes, F-44000, Nantes (France)
  • 4. Commonwealth Scientific and Industrial Research Organization (CSIRO) Manufacturing, Clayton, Victoria, 3168 (Australia)

Description

Highlights: • XPS peak fitting is often performed with too many fit parameters. • An excess of fit parameters leads to local minima in a fit space. • Box plots identify fitting protocols with too many varying parameters. • Box plots are illustrated using four- and ten-component fits to a moderately complex C 1s spectrum. • Box plots, Monte Carlo analysis, and uniqueness plots identify different aspects of poor peak fitting. While peak fitting of spectra/data is frequently performed in science, recent reports suggest that the quality of peak fitting in the scientific literature is often inadequate. Here, we describe a new statistical tool for determining the quality of fitting protocols, illustrating this capability with X-ray photoelectron spectroscopy (XPS) data. This tool, box plots of random starting conditions and their results, helps identify local minima in the multidimensional fit space of the fit parameters. Ideally, there should be a single global minimum for a fitting protocol such that different, reasonable starting conditions lead to the same result. To determine whether a fit space contains multiple local minima, a series of reasonable starting conditions is randomly chosen for the fit. If the boxes in the box plot of the peak areas of these multiple fits are narrow, the different possibilities converge to a single global minimum. Conversely, if the boxes are wide, multiple local minima are present. This method is related to the mathematical concept of 'disproof by contradiction'. Our approach is demonstrated with four- and ten-component fits to a moderately complex C 1s XPS narrow scan. The results from our analysis compare favorably to those of traditional Monte Carlo analyses and uniqueness plots, where box plots are also applied to the Monte Carlo results, and each of these statistical tools performs a different function/probes a fit space/protocol differently.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.elspec.2021.147094

Additional details

Identifiers

DOI
10.1016/j.elspec.2021.147094;
PII
S0368204821000487;

Publishing Information

Journal Title
Journal of Electron Spectroscopy and Related Phenomena
Journal Volume
250
Journal Page Range
vp.
ISSN
0368-2048
CODEN
JESRAW

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
54054290
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
MONTE CARLO METHOD; PEAKS; RANDOMNESS; SPECTRA; X-RAY PHOTOELECTRON SPECTROSCOPY
Descriptors DEC
CALCULATION METHODS; ELECTRON SPECTROSCOPY; PHOTOELECTRON SPECTROSCOPY; SPECTROSCOPY

Optional Information

Copyright
Copyright (c) 2021 Elsevier B.V. All rights reserved.