Published January 3, 2005
| Version v1
Journal article
Crystal sensor for microscopy applications
Creators
- 1. Pacific Nanotechnology, Inc., Santa Clara, California 95054 (United States)
Description
We report a force sensor based on a quartz crystal that is used for measuring nanoscale topographic images. The crystal is a length-extensional mode oscillator with a resonant frequency of about 650 kHz. Compared to 33 kHz tuning forks, such crystal sensors have a much higher resonance frequency, which allows for high force sensitivity and a fast response time. The crystal sensor is operated in the shear-force mode, with the probes vibrating parallel to the sample surface. The tip-sample interaction during operation is estimated to be less than 300 pN
Additional details
Identifiers
- DOI
- 10.1063/1.1846156;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 86
- Journal Issue
- 1
- Journal Page Range
- p. 014107-014107.3
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36080148
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CRYSTALS; IMAGES; KHZ RANGE; MICROSCOPY; NANOSTRUCTURES; OSCILLATORS; QUARTZ; RESONANCE; SENSITIVITY; TOPOGRAPHY
- Descriptors DEC
- ELECTRONIC EQUIPMENT; EQUIPMENT; FREQUENCY RANGE; MINERALS; OXIDE MINERALS
Optional Information
- Notes
- (c) 2005 American Institute of Physics