Published June 15, 2009 | Version v1
Journal article Metadata-only

Magnetic studies on ZnTe:Cr film grown on glass substrate by thermal evaporation method

Creators

  • 1. Thin Films and Nonmaterials Lab, Department of Physics, Bharathiar University, Coimbatore 641046 (India)
  • 2. Department of Nanoscience and Technology, Bharathiar University, Coimbatore 641046 (India)
  • 3. National Institute of Metrology (TUBITAK-UME), P.K. 54, 41470, Gebze-Kocaeli (Turkey)
  • 4. Institut de Physique et Chimie des Materiaux de Strasbourg, UMR CNRS-ULP-ECPM 7504, 23, rue du Loess, BP 43, 67034 Strasbourg cedex (France)
  • 5. Universidad Nacional Autonoma de Mexico, Instituto de Investigaciones en Materiales, Mexico, D.F. AP 70-360, 04510 (Mexico)
  • 6. Department of Physics, Dongguk University, Seoul 100-715 (Korea, Republic of)

Description

ZnTe and ZnTe:Cr films were prepared on glass substrate by using thermal evaporation method. X-ray diffraction analysis revealed the presence of ZnCrTe phase. X-ray photoelectron spectroscopy was used to estimate the composition of as-prepared films. The valence state of Cr in ZnTe:Cr film is determined to be +2 by using electron spin resonance spectroscopy. Magnetic moment data as a function of magnetic field was recorded by using superconducting quantum interference device magnetometry at 300 K. The result showed a clear hysteresis loop with coercive field of 48 Oe. Magnetic domains were observed by using magnetic force microscopy and the average value of domain size was 3.7 nm.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2009.04.012

Additional details

Identifiers

DOI
10.1016/j.apsusc.2009.04.012;
PII
S0169-4332(09)00386-9;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
255
Journal Issue
17
Journal Page Range
p. 7517-7523
ISSN
0169-4332
CODEN
ASUSEE

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44017595
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ATOMIC FORCE MICROSCOPY; CHROMIUM ADDITIONS; ELECTRON SPIN RESONANCE; GLASS; MAGNETIC FIELDS; MAGNETIC MOMENTS; MAGNETIC SEMICONDUCTORS; SQUID DEVICES; SUBSTRATES; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY; ZINC TELLURIDES
Descriptors DEC
ALLOYS; CHALCOGENIDES; CHROMIUM ALLOYS; COHERENT SCATTERING; DIFFRACTION; ELECTRON SPECTROSCOPY; ELECTRONIC EQUIPMENT; EQUIPMENT; FLUXMETERS; MAGNETIC RESONANCE; MATERIALS; MEASURING INSTRUMENTS; MICROSCOPY; MICROWAVE EQUIPMENT; PHOTOELECTRON SPECTROSCOPY; RESONANCE; SCATTERING; SEMICONDUCTOR MATERIALS; SPECTROSCOPY; SUPERCONDUCTING DEVICES; TELLURIDES; TELLURIUM COMPOUNDS; TRANSITION ELEMENT ALLOYS; ZINC COMPOUNDS

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.