Published February 1985
| Version v1
Journal article
Microdiffraction in the transmission electron microscope
Creators
Description
Microdiffraction techniques permit the characterization of very small samples of crystalline materials in the transmission electron microscope. Grains less than a micrometer in diameter (in some cases much less) can be identified, can have their symmetry determined, and can have changes in lattice parameter measured. These methods are playing an increasing role in materials science. 7 references, 5 figures
Additional details
Publishing Information
- Journal Title
- J. Met.
- Journal Issue
- p. 42-45
- Series
- J. Met.
- ISSN
- 0022-2674
- CODEN
- JOMTA
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 18066178
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; LATTICE PARAMETERS; TRANSMISSION ELECTRON MICROSCO
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; MICROSCOPY; SCATTERING