Published August 28, 2013 | Version v1
Journal article

Sequential multiphoton multiple ionization of atomic argon and xenon irradiated by x-ray free-electron laser pulses from SACLA

  • 1. Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577 (Japan)
  • 2. Center for Free-Electron Laser Science (CFEL), DESY, D-22607 Hamburg (Germany)
  • 3. RIKEN SPring-8 Center, Kouto 1-1-1, Sayo, Hyogo 679-5148 (Japan)
  • 4. Department of Physics, Kyoto University, Kyoto 606-8502 (Japan)
  • 5. Department of Physical Science, Hiroshima University, Higashi-Hiroshima 739-8526 (Japan)
  • 6. Synchrotron SOLEIL, L'Orme des Merisiers, Saint-Aubin, BP 48, F-91192 Gif-sur-Yvette Cedex (France)
  • 7. Department of Physics and Astronomy, Uppsala University, PO Box 516, SE-751 20 Uppsala (Sweden)
  • 8. Department of Physics, Lund University, PO Box 118, SE-22100 Lund (Sweden)
  • 9. Blackett Laboratory, Imperial College London, London SW7 2AZ (United Kingdom)
  • 10. Department of Physics and Astronomy, University of Turku, FI-20014 (Finland)
  • 11. Max-Planck Advanced Study Group at CFEL, D-22607 Hamburg (Germany)

Description

We have investigated multiphoton multiple ionization of argon and xenon atoms at 5 keV using a new x-ray free electron laser (XFEL) facility, the SPring-8 Angstrom Compact free electron LAser (SACLA) in Japan. The experimental results are compared with the new theoretical results presented here. The absolute fluence of the XFEL pulse has been determined with the help of the calculations utilizing two-photon processes in the argon atom. The high charge states up to +22 observed for Xe in comparison with the calculations point to the occurrence of sequential L-shell multiphoton absorption and of resonance-enabled x-ray multiple ionization. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/0953-4075/46/16/164024

Additional details

Publishing Information

Journal Title
Journal of Physics. B, Atomic, Molecular and Optical Physics
Journal Volume
46
Journal Issue
16
Journal Page Range
[7 p.]
ISSN
0953-4075
CODEN
JPAPEH