Effect of middle-energy electron deviation by a dielectric surface
- 1. Tomskij Politekhnicheskij Inst. (USSR). Inst. Yadernoj Fiziki, Ehlektroniki i Avtomatiki
Description
The effect of fast electron deflection by a electric field of a space charge induced in dielectrics under irradiation with a narrow collimated beam at splitting incidence angles is detected; the effect of dielectric plate bending on the degree of beam deflection by such a charged mirror is determined. The investigations carried out are of great importance of the dielectric charging process in the phenomenon of small-angular electron reflection from its surface. The process reflection from its surface. The process of charge accumulation in dielectric under irradiation, dynamics of partial relaxation of an accumulated charge, change in angular characteristics of the electron beam deflection from different angles, etc. are explicitly developed on photographs obtained for angular distribution of scattered electrons
Additional details
Additional titles
- Original title (Russian)
- Эффект отклонения электронов средней энергии поверхностью диэлектрика
Publishing Information
- Journal Title
- Doklady Akademii Nauk SSSR
- Journal Volume
- 302
- Journal Issue
- 4
- Series
- Dokl. Akad. Nauk SSSR.
- Journal Page Range
- 835-838
- ISSN
- 0002-3264
- CODEN
- DANKA
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- USSR
- INIS RN
- 20027609
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANGULAR DISTRIBUTION; BENDING; DIELECTRIC MATERIALS; ELECTRON BEAMS; GLASS; MEV RANGE 01-10; REFLECTION; RELAXATION; SPACE CHARGE; TIME DEPENDENCE
- Descriptors DEC
- BEAMS; DEFORMATION; DISTRIBUTION; ENERGY RANGE; LEPTON BEAMS; MATERIALS; MEV RANGE; PARTICLE BEAMS