Analysis of distributed-feedback and distributed-Bragg deflector laser structures by method of multiple reflections

A new method based on multiple reflections is proposed here for analyzing thin-film Bragg devices in integrated optics. Expressions are derived for reflection and transmission coefficients at the interface between a uniform and periodic waveguide. The method is used to find the response of distributed-feedback laser amplifiers and the noise output of distributed-Bragg-reflector lasers.