Published March 2007 | Version v1
Journal article

Oscillatory magnetism of palladium nano-film depending on its film thickness: Density functional study

  • 1. Department of Physics, University of Ulsan, Ulsan 680-749 (Korea, Republic of)
  • 2. Department of Physics, Inha University, Incheon 402-751 (Korea, Republic of)
  • 3. Department of Physics, University of California, Irvine, CA 92697 (United States)

Description

In order to investigate the magnetism of palladium nano-films, we performed first-principles calculations employing the highly precise full-potential linerized augmented plane-wave method based on density functional theory. The magnetism is investigated as a function of the thickness of the Pd thickness within a range of 1-21 monolayers. The magnetic stability of the Pd nano-films is calculated to depend delicately on its thickness. The ferromagnetic state is calculated to be stable for only some particular thicknesses of 1, 3, 9, and 15 layers. Invoking the ferromagnetism is not due to the localization at the surface but to the high density of states (DOS) at Fermi energy at the second layer from the surface

Additional details

Identifiers

DOI
10.1016/j.jmmm.2006.10.1116;
PII
S0304-8853(06)02080-4;

Publishing Information

Journal Title
Journal of Magnetism and Magnetic Materials
Journal Volume
310
Journal Issue
2
Journal Page Range
p. 2262-2264
ISSN
0304-8853
CODEN
JMMMDC

Conference

Title
17. International Conference on Magnetism
Dates
20-25 Aug 2006
Place
Kyoto (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39024929
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DENSITY FUNCTIONAL METHOD; FERROMAGNETISM; FILMS; LAYERS; PALLADIUM; STABILITY; SURFACES; WAVE PROPAGATION
Descriptors DEC
CALCULATION METHODS; ELEMENTS; MAGNETISM; METALS; PLATINUM METALS; TRANSITION ELEMENTS; VARIATIONAL METHODS

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.