Published 1994
| Version v1
Miscellaneous
A method for the semiconductor surface treatment analysis using multiple X-ray diffraction
Creators
- 1. Universidade Estadual de Campinas, SP (Brazil)
Description
Short communication
Additional details
Additional titles
- Original title (Portuguese)
- Um metodo para a analise do tratamento da superficie de semicondutores usando a difracao multipla de raios-X
Publishing Information
- Imprint Title
- Proceedings of the 17. national meeting on condensed matter physics: abstracts
- Imprint Pagination
- 427 p.
- Journal Page Range
- p. 70.
Conference
- Title
- 17. Brazilian meeting on condensed matter physics.
- Original Conference Title
- 17. Encontro nacional de fisica da materia condensada
- Dates
- 7-11 Jun 1994.
- Place
- Caxambu, MG (Brazil).
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 27080098
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference, No Abstract, Non-conventional Literature
- Descriptors DEI
- DIFFRACTION; RADIATIONS; SCATTERING; SEMICONDUCTOR MATERIALS; SOLID STATE PHYSICS; SURFACE PROPERTIES; SURFACE TREATMENTS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; MATERIALS; PHYSICS
Optional Information
- Notes
- Imprint:Anais do 17. encontro nacional de fisica da materia condensada: resumos.