Published May 1, 2005
| Version v1
Report
Segmented foil SEM grids at Fermilab
Description
We present recent beam data from a new design of a profile monitor for proton beams at Fermilab. The monitors, consisting of grids of segmented Ti foils 5 (micro)m thick, are secondary-electron emission monitors (SEM's). We review data on the device's precision on beam centroid position, beam width, and on beam loss associated with the SEM material placed in the beam
Availability note (English)
Available from PURL: https://www.osti.gov/servlets/purl/15017094-fx5f3i/native/Additional details
Identifiers
Publishing Information
- Imprint Pagination
- 4 p.
- Report number
- FERMILAB-CONF--05-092-AD
Conference
- Title
- Particle Accelerator Conference (PAC 05)
- Dates
- 16-20 May 2005
- Place
- Knoxville, TN (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 36104769
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- ACCELERATORS; ACCURACY; BEAM PROFILES; DESIGN; FERMILAB; MONITORS; PROTON BEAMS
- Descriptors DEC
- BEAMS; MEASURING INSTRUMENTS; NATIONAL ORGANIZATIONS; NUCLEON BEAMS; PARTICLE BEAMS; US DOE; US ORGANIZATIONS
Optional Information
- Contract/Grant/Project number
- arXiv eprint number physics/0506194; AC--02-76CH03000
- Funding organization
- US Department of Energy (United States)