Published January 1991
| Version v1
Journal article
Position sensitive detector of soft x-radiation and alpha particles on the charge-coupled device base
- 1. Joint Inst. for Nuclear Research, Dubna (Russian Federation)
Description
The position-sensitive detector based on a matrix of charge-coupled devices (CCD) operating on-line with the Pravets personal computer is designed. Application of the yttrium oxysulfide as a converter and give an opportunity to obtain 1300 electrons in CCD matrix per 1 photon absorbed in a phosphore for 8 keV X-ray photons. The detector ensures detection of single 5.5 MeV α particles. Spatial resolution for the detector with Y2O2S-Tb phosphore 40 mm in-diameter is about 350 μm for both X-ray photons and α particles. Detection efficiency nonuniformity over the detector area is ≤1% when the correcting matrix is used
Additional details
Additional titles
- Original title (Russian)
- Позиционно-чувствительный детектор мягкого рентгеновского излучения и α-частиц на основе приборов с зарядовой связью
Publishing Information
- Journal Title
- Pribory i Tekhnika Ehksperimenta
- Journal Issue
- no.1
- Journal Page Range
- p. 79-85.
- ISSN
- 0032-8162
- CODEN
- PRTEAJ
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- Russian Federation
- INIS RN
- 25001000
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ALPHA DETECTION; CHARGE-COUPLED DEVICES; DATA PROCESSING; EFFICIENCY; FLOWSHEETS; IMAGE CONVERTERS; INORGANIC PHOSPHORS; KEV RANGE 01-10; ON-LINE MEASUREMENT SYSTEMS; POSITION SENSITIVE DETECTORS; SENSITIVITY; SIGNAL-TO-NOISE RATIO; SOFT X RADIATION; SOLID SCINTILLATION DETECTORS; SPATIAL RESOLUTION; X-RAY DETECTION
- Descriptors DEC
- CHARGED PARTICLE DETECTION; DETECTION; DIAGRAMS; ELECTROMAGNETIC RADIATION; ENERGY RANGE; IMAGE TUBES; INFORMATION; INORGANIC COMPOUNDS; KEV RANGE; MEASURING INSTRUMENTS; ON-LINE SYSTEMS; PHOSPHORS; RADIATION DETECTION; RADIATION DETECTORS; RADIATIONS; RESOLUTION; SCINTILLATION COUNTERS; SEMICONDUCTOR DEVICES; X RADIATION