Published January 11, 2010
| Version v1
Journal article
Radiation hardness of p-type silicon detectors
Creators
- 1. Department of Physics, University of Liverpool, O. Lodge Lab., Oxford St., Liverpool L69 7ZE (United Kingdom)
Description
Finely segmented silicon detectors made with n-side readout on p-type substrate have emerged as the most promising choice for the replacement of the tracker systems for the CERN LHC upgrade to higher luminosity. They have practically assumed the status of baseline devices for the silicon microstrip layers of the upgrades, and are now also being considered as possible candidates even for the innermost pixel layers. A review of the reasons for the success of the p-type bulk devices is presented here.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2009.08.050Additional details
Identifiers
- DOI
- 10.1016/j.nima.2009.08.050;
- PII
- S0168-9002(09)01570-8;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 612
- Journal Issue
- 3
- Journal Page Range
- p. 464-469
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 7. international conference on radiation effects on semiconductor materials, detectors and devices
- Acronym
- RESMDD 2008
- Dates
- 10-13 Oct 2008
- Place
- Florence (Italy)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41083102
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CERN LHC; EQUIPMENT; LAYERS; LUMINOSITY; READOUT SYSTEMS; SI SEMICONDUCTOR DETECTORS; SILICON; SUBSTRATES
- Descriptors DEC
- ACCELERATORS; CYCLIC ACCELERATORS; ELEMENTS; MEASURING INSTRUMENTS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMIMETALS; STORAGE RINGS; SYNCHROTRONS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.