Published January 11, 2010 | Version v1
Journal article

Radiation hardness of p-type silicon detectors

  • 1. Department of Physics, University of Liverpool, O. Lodge Lab., Oxford St., Liverpool L69 7ZE (United Kingdom)

Description

Finely segmented silicon detectors made with n-side readout on p-type substrate have emerged as the most promising choice for the replacement of the tracker systems for the CERN LHC upgrade to higher luminosity. They have practically assumed the status of baseline devices for the silicon microstrip layers of the upgrades, and are now also being considered as possible candidates even for the innermost pixel layers. A review of the reasons for the success of the p-type bulk devices is presented here.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2009.08.050

Additional details

Identifiers

DOI
10.1016/j.nima.2009.08.050;
PII
S0168-9002(09)01570-8;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
612
Journal Issue
3
Journal Page Range
p. 464-469
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
7. international conference on radiation effects on semiconductor materials, detectors and devices
Acronym
RESMDD 2008
Dates
10-13 Oct 2008
Place
Florence (Italy)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41083102
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CERN LHC; EQUIPMENT; LAYERS; LUMINOSITY; READOUT SYSTEMS; SI SEMICONDUCTOR DETECTORS; SILICON; SUBSTRATES
Descriptors DEC
ACCELERATORS; CYCLIC ACCELERATORS; ELEMENTS; MEASURING INSTRUMENTS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMIMETALS; STORAGE RINGS; SYNCHROTRONS

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.