Magnetotransport study of Dirac metal FeSn thin films grown on silicon substrates
- 1. Department of Physics and The Vitreous State Laboratory, The Catholic University of America, Washington DC, 20064 (United States)
Description
Thin films of iron-tin alloy FeSn are grown on silicon substrates and their structural and transport properties are investigated for the first time. Herein, the molecular beam epitaxy method is used to grow 50 and 30 nm thick FeSn films on silicon substrates containing 10 nm of MgO as a buffer layer. The films are characterized structurally using an X-ray diffractometer, showing a hexagonal crystal structure with the space group P6/mmm (191). The results from electrical and magnetotransport measurements show these films exhibit characteristics close to metals. Herein, the magnetotransport properties of the thin films which show positive magnetoresistance and sample-dependent Hall effect with possible multiband transport are further measured. (© 2023 Wiley‐VCH GmbH)
Availability note (English)
Available from: http://dx.doi.org/10.1002/pssa.202200677Additional details
Identifiers
Publishing Information
- Journal Title
- Physica Status Solidi. A, Applications and Materials Science (Online)
- Journal Volume
- 220
- Journal Issue
- 9
- Journal Page Range
- p. 1-6
- ISSN
- 1862-6319
- CODEN
- PSSABA
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 54075260
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; BUFFERS; HALL EFFECT; HEXAGONAL LATTICES; IRON ALLOYS; MAGNESIUM OXIDES; MAGNETORESISTANCE; MOLECULAR BEAM EPITAXY; SCANNING ELECTRON MICROSCOPY; SILICON; SPACE GROUPS; SUBSTRATES; TEMPERATURE RANGE 0013-0065 K; TEMPERATURE RANGE 0065-0273 K; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; TIN ALLOYS; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; ALLOYS; CHALCOGENIDES; COHERENT SCATTERING; CRYSTAL GROWTH METHODS; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELEMENTS; EPITAXY; FILMS; MAGNESIUM COMPOUNDS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; SEMIMETALS; SPECTROSCOPY; SYMMETRY GROUPS; TEMPERATURE RANGE; THREE-DIMENSIONAL LATTICES; TRANSITION ELEMENT ALLOYS
Optional Information
- Notes
- AID: 2200677