Published November 15, 2006
| Version v1
Journal article
Uniform magnetic excitations in NiO nanoparticles
- 1. Materials Research Department, Riso National Laboratory, DK-4000 Roskilde (Denmark) and Department of Physics, Technical University of Denmark, DK-2800 Kgs. Lyngby (Denmark)
- 2. Materials Research Department, Riso National Laboratory, DK-4000 Roskilde (Denmark)
- 3. Department of Physics, Technical University of Denmark, DK-2800 Kgs. Lyngby (Denmark)
Description
A sample of isolated disc shaped NiO nanoparticles was studied at the RITA-II triple axis spectrometer at SINQ (PSI) using the newly implemented multi-analyser blade imaging mode. The particles were 13nm in diameter and had a thickness of about 2.5nm. A non-dispersive spin excitation was observed at the antiferromagnetic (121212) reflection at a scattering vector of κ=1.30A-1, at an energy of 0.51+/-0.02meV. This is shown to be due to uniform magnetic excitations in the nanoparticles
Additional details
Identifiers
- DOI
- 10.1016/j.physb.2006.05.234;
- PII
- S0921-4526(06)00991-4;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 385-386
- Journal Page Range
- p. 398-400
- ISSN
- 0921-4526
- CODEN
- PHYBE3
Conference
- Title
- 8. international conference on neutron scattering
- Dates
- 27 Nov - 2 Dec 2005
- Place
- Sydney (Australia)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38076424
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANTIFERROMAGNETISM; EXCITATION; NANOSTRUCTURES; NEUTRON DIFFRACTION; NEUTRON SPECTROMETERS; NICKEL OXIDES; PARTICLES; REFLECTION; SPIN
- Descriptors DEC
- ANGULAR MOMENTUM; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ENERGY-LEVEL TRANSITIONS; MAGNETISM; MEASURING INSTRUMENTS; NICKEL COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PARTICLE PROPERTIES; SCATTERING; SPECTROMETERS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.