Published August 1993
| Version v1
Journal article
Temperature dependence of radiation damage and its annealing in silicon detectors
Creators
- Ziock, H.J.1
- Boissevain, J.G.1
- Holzscheiter, K.1
- Kapustinsky, J.S.1
- Palounek, A.P.T.1
- Sondheim, W.E.1
- Barberis, E.2
- Cartiglia, N.2
- Leslie, J.2
- Pitzl, D.2
- Rowe, W.A.2
- Sadrozinski, H.F.W.2
- Seiden, A.2
- Spencer, E.2
- Wilder, M.2
- Ellison, J.A.3
- Fleming, J.K.3
- Jerger, S.3
- Joyce, D.3
- Lietzke, C.3
- Reed, E.3
- Wimpenny, S.J.3
- Ferguson, P.4
- Frautschi, M.A.5
- Matthews, J.A.J.5
- Skinner, D.5
- 1. Los Alamos National Lab., NM (United States)
- 2. Univ. of California, Santa Cruz, CA (United States). Santa Cruz Inst. for Particle Physics
- 3. Univ. of California, Riverside, CA (United States)
- 4. Univ. of Missouri, Rolla, MO (United States)
- 5. Univ. of New Mexico, Albuquerque, NM (United States)
Description
The radiation damage resulting from the large particle fluences predicted at the Superconducting Super Collider will induce significant leakage currents in silicon detectors. In order to limit those currents, the authors plan to operate the detectors at reduced temperatures (∼ 0 C). In this paper, they present the results of a study of temperature effects on both the initial radiation damage and the long-term annealing of that damage in silicon PIN detectors. Depletion voltage results are reported. The detectors were exposed to approximately 1014/cm2 650 MeV protons. Very pronounced temperature dependencies were observed
Additional details
Publishing Information
- Journal Title
- IEEE Transactions on Nuclear Science
- Journal Volume
- 40
- Journal Issue
- 4 part 1
- Journal Page Range
- p. 344-348.
- ISSN
- 0018-9499
- CODEN
- IETNAE
Conference
- Title
- Institute of Electrical and Electronic Engineers (IEEE) nuclear science symposium and medical imaging conference.
- Dates
- 25-31 Oct 1992.
- Place
- Orlando, FL (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 25019160
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- ANNEALING; EXPERIMENTAL DATA; LEAKAGE CURRENT; PROTONS; RADIATION EFFECTS; SI SEMICONDUCTOR DETECTORS; SUPERCONDUCTING SUPER COLLIDER; TEMPERATURE DEPENDENCE
- Descriptors DEC
- ACCELERATORS; BARYONS; CATIONS; CHARGED PARTICLES; CURRENTS; CYCLIC ACCELERATORS; DATA; ELECTRIC CURRENTS; ELEMENTARY PARTICLES; FERMIONS; HADRONS; HEAT TREATMENTS; HYDROGEN IONS; HYDROGEN IONS 1 PLUS; INFORMATION; IONS; MEASURING INSTRUMENTS; NUCLEONS; NUMERICAL DATA; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; STORAGE RINGS; SYNCHROTRONS
Optional Information
- Secondary number(s)
- CONF-921005--.