Enhanced Characterization of Niobium Surface Topography

Surface topography characterization is a continuing issue for the Superconducting Radio Frequency (SRF) particle accelerator community. Efforts are underway to both to improve surface topography, and its characterization and analysis using various techniques. In measurement of topography, Power Spectral Density (PSD) is a promising method to quantify typical surface parameters and develop scale-specific interpretations. PSD can also be used to indicate how chemical processes modifiesy the roughnesstopography at different scales. However, generating an accurate and meaningful topographic PSD of an SRF surface requires careful analysis and optimization. In this report, polycrystalline surfaces with different process histories are sampled with AFM and stylus/white light interferometer profilometryers and analyzed to indicate trace topography evolution at different scales. evolving during etching or polishing. Moreover, Aan optimized PSD analysis protocol will be offered to serve the SRF surface characterization needs is presented.