Plasma focus as intense light source for soft x-ray microscopy
Creators
- 1. RWTH Lehrstuhl fuer Lasertechnik, Aachen (West Germany)
- 2. FhG-Institute fuer Lasertechnik, Aachen (West Germany)
Description
A plasma focus operating in nitrogen is developed as an x-ray source for the laboratory type x-ray microscope. The radiation has to be emitted into the ''window'' (2.33 nm--4.37 nm) with a reciprocal relative bandwidth (RRB) of λ/Δλ>200. The nearly coinciding Lyman-α line of nitrogen VII λ=2.48 nm and the second resonance line of nitrogen VI at λ=2.49 nm are chosen. For the use in the microscope the end on diameter of the source has to be about 200 μm with a spatial jitter below 100 μm. A prototype of the source has been examined in its spatial, temporal and spectral properties. The higher ionization cross sections of nitrogen compared to noble gases influences the start of the discharge. First experiments with Fresnel condenser zone plates (CZP) as a tool for plasma soft x-ray emission diagnostics are presented. Experimental results are compared with non LTE modeling of the collapse and pinch phase of the plasma focus
Additional details
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 195
- Journal Issue
- 1
- Series
- AIP Conf. Proc.
- Journal Page Range
- 507-514
- ISSN
- 0094-243X
- CODEN
- APCPC
Conference
- Title
- 2. international conference on high-density pinches (ICHDP-2).
- Dates
- 26-28 Apr 1989.
- Place
- Laguna Beach, CA (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 22010775
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- CROSS SECTIONS; EXPERIMENTAL DATA; IMAGES; IONIZATION; LINEAR Z PINCH DEVICES; MICROSCOPY; NITROGEN; PINCH EFFECT; PLASMA DIAGNOSTICS; PLASMA FOCUS; SOFT X RADIATION; X-RAY SOURCES
- Descriptors DEC
- DATA; ELECTROMAGNETIC RADIATION; ELEMENTS; INFORMATION; IONIZING RADIATIONS; LINEAR PINCH DEVICES; NONMETALS; NUMERICAL DATA; OPEN PLASMA DEVICES; PINCH DEVICES; RADIATION SOURCES; RADIATIONS; THERMONUCLEAR DEVICES; X RADIATION
Optional Information
- Secondary number(s)
- CONF-8904107--.