Published September 2011
| Version v1
Journal article
Estimation of grain boundary diffusivity in near-α titanium polycrystals
- 1. University of Dayton Research Institute, Dayton, OH (United States)
- 2. US Air Force Research Laboratory, Materials and Manufacturing Directorate, AFRL/RXLM, Wright-Patterson Air Force Base, OH (United States)
Description
The role of enhanced grain boundary diffusivity in high-temperature diffusion of interstitial elements through metals is widely recognized but poorly characterized in most materials. This paper summarizes an effort to estimate grain boundary diffusivity of oxygen in a near-α titanium alloy, Ti-6Al-2Sn-4Zr-2Mo-0.1Si, by explicitly incorporating microstructure obtained from electron backscatter diffraction into an analytical model. Attention is focused on near-surface diffusion behavior contributing to the rapid ingress of oxygen and possible crack initiation in high-temperature environments.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.scriptamat.2011.06.015Additional details
Identifiers
- DOI
- 10.1016/j.scriptamat.2011.06.015;
- PII
- S1359-6462(11)00343-5;
Publishing Information
- Journal Title
- Scripta Materialia
- Journal Volume
- 65
- Journal Issue
- 6
- Journal Page Range
- p. 513-515
- ISSN
- 1359-6462
- CODEN
- SCMAF7
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45024622
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM ALLOYS; BACKSCATTERING; CRACK PROPAGATION; DIFFUSION; GRAIN BOUNDARIES; MOLYBDENUM ALLOYS; OXIDATION; OXYGEN; POLYCRYSTALS; SILICON ADDITIONS; SURFACES; TEMPERATURE DEPENDENCE; TIN ALLOYS; TITANIUM BASE ALLOYS; TITANIUM-ALPHA; ZIRCONIUM ALLOYS
- Descriptors DEC
- ALLOYS; CHEMICAL REACTIONS; CRYSTALS; ELEMENTS; METALS; MICROSTRUCTURE; NONMETALS; SCATTERING; SILICON ALLOYS; TITANIUM; TITANIUM ALLOYS; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.