Structure and properties of NiFe/NiFeO magnetic superlattice
Creators
- 1. Recording Heads, Seagate Technology LLC, Bloomington, Minnesota 55435 (United States)
Description
Using a sequence of the sputtering deposition and the natural oxidation at low oxygen partial pressure, a thin (total thickness of 533-900 A) superlattice was produced consisting of NiFe18 and (NiFe18)O layers on Si, Si/SiO2, and GaAs substrates. The thickness of the as-deposited NiFe layers was in the range 9-533 A. It was found that the thickness of the NiFe film oxidizing as a result of the natural oxidation is limited to 10 A and produces about 16 A of the resulting NiFeO. It was determined that resistivity, saturation magnetization, magnetic anisotropy, and permeability could be controlled in the wide range of values by changing the thickness of the NiFe layers of the NiFe/NiFeO superlattice. Resistivity could be increased by up to two orders of magnitude and the Hk value could be increased by up to four times with respect to those of the NiFe18 film of a comparable thickness. Stress measurements were performed in a wide range of temperature to characterize the coefficient of thermal expansion and the biaxial modulus of the superlattice. Both values were found to be essentially identical to those of NiFe18 alloy. Thermal stability of the transport and magnetic properties of the NiFe/NiFeO superlattice with respect to 225 deg. C magnetic annealing was also determined
Additional details
Identifiers
- DOI
- 10.1063/1.1854279;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 97
- Journal Issue
- 10
- Journal Page Range
- p. 10J116-10J116.3
- ISSN
- 0021-8979
- CODEN
- JAPIAU
Conference
- Title
- 49. annual conference on magnetism and magnetic materials
- Dates
- 7-11 Nov 2004
- Place
- Jacksonville, FL (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37026016
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANISOTROPY; ANNEALING; COERCIVE FORCE; DEPOSITION; ELECTRIC CONDUCTIVITY; FERROMAGNETIC MATERIALS; GALLIUM ARSENIDES; MAGNETIC SUSCEPTIBILITY; MAGNETIZATION; OXIDATION; OXYGEN; PARTIAL PRESSURE; PERMALLOY; PERMEABILITY; SILICON OXIDES; SPUTTERING; SUPERLATTICES; TEMPERATURE RANGE 0400-1000 K; THERMAL EXPANSION; THIN FILMS
- Descriptors DEC
- ALLOYS; ARSENIC COMPOUNDS; ARSENIDES; CHALCOGENIDES; CHEMICAL REACTIONS; ELECTRICAL PROPERTIES; ELEMENTS; EXPANSION; FILMS; GALLIUM COMPOUNDS; HEAT TREATMENTS; IRON ALLOYS; MAGNETIC MATERIALS; MAGNETIC PROPERTIES; MATERIALS; NICKEL ALLOYS; NONMETALS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; PNICTIDES; SILICON COMPOUNDS; TEMPERATURE RANGE; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENT ALLOYS
Optional Information
- Notes
- (c) 2005 American Institute of Physics