Simulation of electron energy loss near-edge structure at the Al and N K edges and Al L23 edge in cubic aluminium nitride
Creators
Description
Calculations of electron energy near edge structures (ELNES) are compared with experimental data obtained in a high-resolution transmission electron microscope. This study concerns small precipitates of aluminium nitride in low carbon steels. The ELNES technique allows to clearly establish that these precipitates crystallize in a cubic rather than in a hexagonal crystallographic cell. The influence on simulated spectra of different parameters are investigated: the size of the atomic shell and its relation with the electron inelastic mean free path. We also examine the influence of the core hole and the sensitivity to cell parameters. We particularly examine the Al L23 near edge structure and features relating to the different transition channels (A1g, Eg and T2g). Results of a multiple scattering and band structure calculations using ICXANES and WIEN97 codes, respectively, are compared in the region from 0 to 30 eV above the edge onsets. Both calculations are in a rather good agreement
Additional details
Identifiers
- DOI
- 10.1016/S0304-3991;
- PII
- S0304399103001475;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 99
- Journal Issue
- 1
- Journal Page Range
- p. 49-64
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37042310
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- ALUMINIUM; ALUMINIUM NITRIDES; CARBON STEELS; CRYSTALLOGRAPHY; ELECTRONIC STRUCTURE; ELECTRONS; ENERGY-LOSS SPECTROSCOPY; EV RANGE 10-100; EXPERIMENTAL DATA; MEAN FREE PATH; MULTIPLE SCATTERING; SENSITIVITY; SIMULATION; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- ALLOYS; ALUMINIUM COMPOUNDS; CARBON ADDITIONS; DATA; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTARY PARTICLES; ELEMENTS; ENERGY RANGE; EV RANGE; FERMIONS; INFORMATION; IRON ALLOYS; IRON BASE ALLOYS; LEPTONS; METALS; MICROSCOPY; NITRIDES; NITROGEN COMPOUNDS; NUMERICAL DATA; PNICTIDES; SCATTERING; SPECTROSCOPY; STEELS; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.