Published November 2014 | Version v1
Journal article

Effects of annealing temperature on the structure and static magnetic properties of NiZnCo ferrite thin films

  • 1. College of Optoelectronic Technology, Chengdu University of Information Technology, Chengdu 610225 (China)
  • 2. State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054 (China)

Description

The Ni0.22Zn0.52Co0.03Fe2.23O4 ferrite thin films are deposited on Si (100) substrate by a radio-frequency magnetron sputtering method. The structure and magnetic properties of NiZnCo ferrite thin films with different annealing temperatures (600 °C, 700 °C, 800 °C and 900 °C) have been investigated. The secondary impurity phases of Fe2O3 and ZnO slowly disappeared with annealing temperature up to 800 °C. But, there are some FeSiO3, Zn2SiO4 and SiO2 impurity phases formation when the annealing temperature is 900 °C. The average grain size and surface roughness increased with annealing temperature up to 800 °C and then they decreased at 900 °C. The saturation magnetization gradually increases with annealing temperature up to 800 °C and then it decreases at 900 °C. Meanwhile, the coercivity monotonically decreases with annealing temperature up to 900 °C. - Highlights: • Effects of annealing on structural and magnetic properties of NiZnCo ferrite thin films are studied. • There are some impurity phases formation at 900 °C. • Maximum saturation magnetization is achieved at 800 °C. • Coercivity decreases with increasing annealing temperature

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jmmm.2014.05.005

Additional details

Identifiers

DOI
10.1016/j.jmmm.2014.05.005;
PII
S0304-8853(14)00427-2;

Publishing Information

Journal Title
Journal of Magnetism and Magnetic Materials
Journal Volume
368
Journal Page Range
p. 8-11
ISSN
0304-8853
CODEN
JMMMDC

Optional Information

Copyright
Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.