Published April 24, 2006 | Version v1
Journal article

Orientation-dependent grain growth in a bulk nanocrystalline alloy during the uniaxial compressive deformation

  • 1. National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)
  • 2. Experimental Facilities Division, Advanced Phonon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
  • 3. Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996 (United States)
  • 4. Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996 (United States) and Metals and Ceramic Division, Oak Ridge National Laboratory, Oak, Ridge, Tennessee 37831 (US)
  • 5. Department of Chemical Engineering and Materials Science, University of California, Davis, California 95616 (United States)
  • 6. Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996 (United States) and School of Materials and Metallurgy, Northeastern University, Shenyang 110004 (China)

Description

The microstructural evolution during the uniaxial compression of an as-deposited bulk nanocrystalline (nc) Ni-Fe (average grain size d≅23 nm) at ambient temperature was investigated by the high-energy x-ray diffraction (HEXRD) and the transmission-electron microscopy (TEM). HEXRD measurements indicated that the grain growth occurred in the nc Ni-Fe alloy during the uniaxial compression tests and that the grain growth shows orientation dependence, i.e., the grains preferentially grow perpendicular to the loading direction. This preferred grain growth was further confirmed by the TEM observations, indicating that the grains were elongated after the compressive plastic deformation

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
88
Journal Issue
17
Journal Page Range
p. 171914-171914.3
ISSN
0003-6951
CODEN
APPLAB

Optional Information

Notes
(c) 2006 American Institute of Physics