Published January 1, 1988
| Version v1
Journal article
Critical currents in sputtered Nb-Ta multilayers
Description
Critical-current measurements have been made on sputtered Nb-Ta multilayers for both perpendicular and parallel applied field. For large bilayer periods, the pinning force behaves as h(1-h) and is due to dislocation pinning. As the bilayer period decreases, the pinning force decreases and changes over to a collective mechanism. For parallel applied field, there is a lack of temperature scaling and an increase in the pinning force, which is due to pinning by the multilayering. A search for the existence of other effects is discussed
Additional details
Publishing Information
- Journal Title
- Phys. Rev., B: Condens. Matter
- Journal Volume
- 37
- Journal Issue
- 1
- Series
- Phys. Rev., B: Condens. Matter.
- Journal Page Range
- 68-74
- ISSN
- 0163-1829
- CODEN
- PRBMD
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 19039888
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CRITICAL CURRENT; CRITICAL FIELD; DISLOCATION PINNING; MAGNETIC FIELDS; MAGNETIC FLUX; NIOBIUM; SPUTTERING; SUPERCONDUCTIVITY; TANTALUM; VAPOR DEPOSITED COATINGS
- Descriptors DEC
- COATINGS; CURRENTS; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; ELECTRICAL PROPERTIES; ELEMENTS; METALS; PHYSICAL PROPERTIES; TRANSITION ELEMENTS