Published November 1995 | Version v1
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Particle trapping with an rf cavity

Description

It is in principle possible to trap charged particles in an rf cavity. In this note the authors calculate the trapping mechanism of the field pattern given by (1). The trapping occurs for either sign of the charge of the particles. The mode pattern (1) traps particles around the node point (0,0,0). Such a trapping mechanism is of course considered favorable for a particle trap. On the other hand, it may also happen that undesirable stray particles are trapped at nodes of an rf device, which then perturbs the normal operation of an accelerator. Such trappings are then undesirable and are to be avoided

Availability note (English)

Available from INIS in electronic form and/or on microfiche ; Also available from OSTI as DE97008416; NTIS; US Govt. Printing Office Dep.

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Additional details

Publishing Information

Imprint Pagination
7 p.
Report number
SLAC-PUB--7072

Conference

Title
31. eloisatron workshop on crystalline beams and related issues.
Dates
11-21 Nov 1995.
Place
Erice (Italy).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
29015620
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCELERATORS; BEAM DYNAMICS; CAVITY RESONATORS; CHARGED PARTICLES; EQUATIONS OF MOTION; OSCILLATION MODES; RF SYSTEMS; TRAPPING
Descriptors DEC
DIFFERENTIAL EQUATIONS; DYNAMICS; ELECTRONIC EQUIPMENT; EQUATIONS; EQUIPMENT; MECHANICS; PARTIAL DIFFERENTIAL EQUATIONS; RESONATORS

Optional Information

Contract/Grant/Project number
Contract AC03-76SF00515
Funding organization
USDOE Office of Energy Research, Washington, DC (United States).
Secondary number(s)
CONF-9511174--5.