Published June 17, 2016
| Version v1
Journal article
Precise mass detector based on carbon nanooscillator
Creators
- 1. Institute for Analytical Instrumentation of RAS, Rizhsky pr 26, St. Petersburg, 190103 (Russian Federation)
- 2. Department of Nanotechnology and Material Science, ITMO University, Kronverskiy av. 49, 192000, St. Petersburg (Russian Federation)
- 3. Academic University, Russian Academy of Sciences, ul. Khlopina 8/3, 194021, St. Petersburg (Russian Federation)
- 4. Centre for Information Optical Technologies, ITMO University, Birzhevaya ln. 14-16, 199034, St. Petersburg (Russian Federation)
Description
Precise mass detectors based on an amorphous carbon nanowires, which localized on the top of a tungsten tip were fabricated and investigated. The nanowires were grown in the scanning electron microscope (SEM) chamber using focused electron beam technique. The movement trajectories and amplitude-frequency characteristics of the carbon nanowire oscillators were visualized at low and ambient pressure using SEM and confocal laser scanning microscope (CLSM), respectevely. The SiO2 and TiO2 nanospheres were clamped on the top of the carbon nanowires. The manipulations of nanospheres were provided by means of dielectrophoretic force in SEM. The sensitivity of the mass detector based on the carbon nanowire oscillator was estimated.
Additional details
Identifiers
- DOI
- 10.1063/1.4954365;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1748
- Journal Issue
- 1
- Journal Page Range
- vp.
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 5. international conference on state-of-the-art trends of scientific research of artificial and natural nanoobjects
- Acronym
- STRANN 2016
- Dates
- 26-29 Apr 2016
- Place
- St. Petersburg (Russian Federation)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48055147
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AMORPHOUS STATE; AMPLITUDES; CARBON; ELECTRON BEAMS; LASER RADIATION; MASS; MICROSCOPES; NANOWIRES; OSCILLATORS; SCANNING ELECTRON MICROSCOPY; SENSITIVITY; SILICA; SILICON OXIDES; TITANIUM OXIDES; TUNGSTEN
- Descriptors DEC
- BEAMS; CHALCOGENIDES; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; LEPTON BEAMS; METALS; MICROSCOPY; MINERALS; NANOSTRUCTURES; NONMETALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PARTICLE BEAMS; RADIATIONS; REFRACTORY METALS; SILICON COMPOUNDS; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2016 Author(s)