Radial profile measurement of electron temperature in edge stochastic magnetic field layer of LHD using intensity ratio of extreme ultraviolet line emissions

Vertical profile of neon line emissions in 30–650 Å wavelength range has been observed in horizontally elongated plasma cross section of Large Helical Device (LHD). Intensity ratio between the neon line emissions is studied to measure the radial profile of electron temperature in the edge stochastic magnetic field layer of LHD. The edge temperature profile successfully obtained from the line ratio of NeVIII 2s-3p to 2p-3s transitions is compared with the simulation based on three-dimensional edge transport code. The result shows a reasonably good agreement with the edge temperature profile analyzed from atomic data and analysis structure code. The electron temperature at last closed flux surface measured from the intensity ratio is also in good agreement with that measured from Thomson scattering.