Published September 21, 2001
| Version v1
Journal article
Front-end electronics for imaging detectors
Creators
Description
Front-end electronics for imaging detectors with large numbers of pixels (105-107) is reviewed. The noise limits as a function of detector capacitance and power dissipation are presented for CMOS technology. Active matrix flat panel imagers (AMFPIs) are discussed and their potential noise performance is illustrated
Additional details
Identifiers
- PII
- S0168900201009639;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 471
- Journal Issue
- 1-2
- Journal Page Range
- p. 192-199
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Germany
- INIS RN
- 34036789
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BACKGROUND NOISE; CAPACITANCE; INTEGRATED CIRCUITS; MOSFET; POSITION SENSITIVE DETECTORS; POWER LOSSES; READOUT SYSTEMS
- Descriptors DEC
- ELECTRICAL PROPERTIES; ELECTRONIC CIRCUITS; ENERGY LOSSES; FIELD EFFECT TRANSISTORS; LOSSES; MEASURING INSTRUMENTS; MICROELECTRONIC CIRCUITS; MOS TRANSISTORS; NOISE; PHYSICAL PROPERTIES; RADIATION DETECTORS; SEMICONDUCTOR DEVICES; TRANSISTORS
Optional Information
- Copyright
- Copyright (c) 2001 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.