Development of atmospheric pressure glow discharge plasma assisted CVD system for the deposition of SiOx coatings
Creators
- 1. Department of Physics, School of Physical Sciences, Kavayitri Bahinabai Chaudhari North Maharashtra University, Jalgaon (M.S.), 425001 (India)
Description
A novel, unique and self-designed radio frequency-based atmospheric pressure glow discharge plasma assisted chemical vapor deposition system (APGD-PACVD) has been developed indigenously for the deposition of SiOx coatings. The developed system has been evaluated for continuous, stable and low temperature plasma source for the deposition of adherent and uniform SiOx thin films on silicon substrates using a plasma of argon, helium and hexamethyldisiloxane (HMDSO) gases. The SiOx films deposited on silicon substrates were characterized by Fourier transform infrared spectroscopy (FTIR), field emmision scanning electron microscopy (FESEM) and energy dispersive x-ray analysis (EDXA) for confirmation of chemical structure of the coating. The results demonstrate the deposition of uniform and adherent SiOx films on silicon.
Availability note (English)
Available from http://dx.doi.org/10.1088/1748-0221/14/06/P06026Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Instrumentation
- Journal Volume
- 14
- Journal Issue
- 06
- Journal Page Range
- p. P06026
- ISSN
- 1748-0221
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 51050638
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ARGON; ATMOSPHERIC PRESSURE; CHEMICAL VAPOR DEPOSITION; COATINGS; DEPOSITS; DESIGN; FOURIER TRANSFORM SPECTROMETERS; FOURIER TRANSFORMATION; GLOW DISCHARGES; HELIUM; INFRARED SPECTRA; ORGANIC SILICON COMPOUNDS; PLASMA; RADIOWAVE RADIATION; SCANNING ELECTRON MICROSCOPY; SILICON; SUBSTRATES; THIN FILMS; X RADIATION
- Descriptors DEC
- CHEMICAL COATING; DEPOSITION; ELECTRIC DISCHARGES; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTS; FILMS; FLUIDS; GASES; INTEGRAL TRANSFORMATIONS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; MICROSCOPY; NONMETALS; ORGANIC COMPOUNDS; RADIATIONS; RARE GASES; SEMIMETALS; SPECTRA; SPECTROMETERS; SURFACE COATING; TRANSFORMATIONS