Feⁿ⁺ beam profile diagnostics based on Al₂O₃: Cr scintillating screen

Some techniques of beam profile measurements such as wire rotating scan, Faraday cups array and infrared imaging were investigated. A measurement device was built based on scintillating screen to cater for the demand of accelerator beam profile diagnostics. The device was bombarded under several tens to hundred nanoampere Feⁿ⁺ (n=5-12) ion beam. The Feⁿ⁺ ion beam experiment shows that the imaging saturation is mainly caused by light intensity rather than scintillating screen. A way to solve the saturation problem with a specially developed lens was mentioned. The grayscale of beam profile imaging is approximately linear with respect to the beam intensity, and the reason for formation of this relationship was analyzed. (authors)