Published January 2021 | Version v1
Journal article

Electrochromic tungsten oxide films prepared by sputtering: Optimizing cycling durability by judicious choice of deposition parameters

  • 1. Department of Materials Science and Engineering, The Ångström Laboratory, Uppsala University, P.O. Box 35, SE-75103 Uppsala (Sweden)

Description

Highlights: • Thin films of W oxide were prepared by reactive DC magnetron sputtering. • The role of critical deposition parameters on the electrochromic performance with foci on electrochemical cycling durability and optical modulation range were investigated. • A judicious choice of deposition parameters could yield films with superior cycling durability. • This work delineates a pathway towards WO3 films with excellent durability of the electrochromic properties. -- Abstract: Thin films of W oxide were prepared by reactive DC magnetron sputtering (5 cm-diameter W target), and their electrochromic (EC) properties were investigated in an electrolyte of LiClO4 in propylene carbonate. The purpose of the study was to elucidate the role of critical deposition parameters—oxygen/argon gas flow ratio for the sputter plasma Γ, total pressure in the sputter plasma ptot, and sputtering power Ps—on the EC performance with foci on electrochemical cycling durability and optical modulation range ΔT. Specifically, we used 0.15 ≤ Γ ≤ 0.90, 5 ≤ ptot ≤ 30 mTorr, and 200 ≤ Ps ≤ 400 W and studied cycling durability for up to 500 voltammetric cycles in the range 2.0–4.0 V vs. Li/Li+ together with optical properties at a wavelength of 528 nm. Most significantly, we discovered that a judicious choice of deposition parameters could yield films with superior cycling durability. Thus a ~300 nm-thick film prepared at Γ = 0.90, ptot = 10 mTorr, and Ps = 200 W showed ΔT ≈ 65% after an initial "training" during ~100 voltammetric cycles; higher values of ptot, on the other hand, yielded films whose ΔTs degraded by ~10% during the cycling, and a lower value of ptot led to dark films with only marginal electrochromism. Hence our work delineates a pathway towards W oxide films with excellent durability of the EC properties.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.electacta.2020.137233

Additional details

Additional titles

Augmented title (English)
Electrochromism;Electrochemical durability;Tungsten oxide;Sputter deposition;Smart window

Identifiers

DOI
10.1016/j.electacta.2020.137233;
PII
S0013468620316261;

Publishing Information

Journal Title
Electrochimica Acta
Journal Volume
367
Journal Page Range
vp.
ISSN
0013-4686
CODEN
ELCAAV

Optional Information

Copyright
Copyright (c) 2020 The Author(s). Published by Elsevier Ltd.