Luminescence characterisation of alumina substrates using cathodoluminescence microscopy and spectroscopy

Polycrystalline alumina (Al₂O₃) substrates, found in many electronic devices and proposed as dosemeters in emergency situations, were invstigated using a scanning electron microscope (SEM) equipped with cathodoluminescence (CL) and elemental analysis probes. The characteristics of the CL spectra, surface morphology, and impurity content of the Al₂O₃ substrates were examined and compared with those of single crystal dosimetry-grade Al₂O₃:C. Whereas the CL spectrum, measured from 250 to 800 nm, for the Al₂O₃:C, contained resolved bands located at ∼340 nm and at ∼410 nm, the spectrum measured with the Al₂O₃ substrate was significantly broader, extending from ∼250 to ∼450 nm, and also included a narrow band at 695 nm. While it is likely that the accepted model of recombination at F⁺ (∼340 nm) and F (∼410 nm) in Al₂O₃:C also applies to the substrate, it is suggested that the presence of impurities within the alumina give rise to additional recombination centres. The 695 nm emission has been assigned to a Cr³⁺ ion impurity in previous work on alumina and a band indicated at ∼300 nm may be associated with Mg²⁺ or Ca²⁺_, the presence of which was confirmed by elemental mapping. Comparison of the spatial distribution of CL with the surface morphology and elemental composition of the samples indicates that the components of the emission spectrum can be qualitatively correlated with impurity content and morphological features of the samples. - Highlights: • Morphological (SEM) and elemental characterisation (EDS/WDs) of alumina substrates. • Cathodoluminescence (CL) emission spectroscopy of alumina substrates. • Close relationship of the CL emission with the SEM and EDs/WDS characteristics