Precision measurements with non-laser-cooled trapped ions
Creators
- 1. Laboratoire Kastler Brossel, Universite Pierre et Marie Curie, 4 place Jussieu, Case 74, 75252 Paris (France)
- 2. Departement de Physique et Modelisation, Universite d'Evry Val d'Essonne, Boulevard F Mitterrand, 91025 Evry cedex (France)
Description
Ion trapping has been applied to many different kinds of high-precision measurements. While applications such as optical spectroscopy and optical frequency standards require laser cooling of the trapped ions, this paper concentrates on how very high precision can be obtained in experiments with non-laser-cooled ions. Two specific topics are addressed: the first one is ultra-high-resolution mass spectrometry and g-factor measurements in Penning traps, and the second one is microwave spectroscopy on large ion ensembles in radiofrequency traps with applications to frequency standards. In both areas, the main motivations and basic experimental techniques are presented. Selected experimental results are described, highlighting the modern refinements of experimental methods which have allowed reduction or elimination of the main systematic effects and improved the accuracy. Finally, future prospects are briefly discussed. (tutorial)
Availability note (English)
Available from http://dx.doi.org/10.1088/0953-4075/42/15/154018Additional details
Identifiers
- DOI
- 10.1088/0953-4075/42/15/154018;
- PII
- S0953-4075(09)09708-9;
Publishing Information
- Journal Title
- Journal of Physics. B, Atomic, Molecular and Optical Physics
- Journal Volume
- 42
- Journal Issue
- 15
- Journal Page Range
- [20 p.]
- ISSN
- 0953-4075
- CODEN
- JPAPEH
Conference
- Title
- 1. workshop on modern applications of trapped ions
- Dates
- 18-23 May 2008
- Place
- Les Houches (France)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41114447
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCURACY; COOLING; IONS; LANDE FACTOR; LASER RADIATION; MASS SPECTROSCOPY; MICROWAVE RADIATION; OPTICAL SPECTROMETERS; PENNING EFFECT; RADIOWAVE RADIATION; RESOLUTION; TRAPPING; TRAPS
- Descriptors DEC
- CHARGED PARTICLES; DIMENSIONLESS NUMBERS; ELECTROMAGNETIC RADIATION; MEASURING INSTRUMENTS; RADIATIONS; SPECTROMETERS; SPECTROSCOPY